Test design

Results: 2041



#Item
411Parametric statistics / Econometrics / Statistical methods / Contrast / Two-way analysis of variance / Variance / F-test / NCSS / Degrees of freedom / Statistics / Statistical tests / Analysis of variance

Balanced Design Analysis of Variance

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Source URL: ncss.wpengine.netdna-cdn.com

Language: English - Date: 2015-01-06 16:07:30
412Electronics / IEEE standards / Embedded systems / Joint Test Action Group / Boundary scan / OnTap / Design for testing / Field-programmable gate array / Berkeley Software Distribution / Electronics manufacturing / Manufacturing / Electronic engineering

onTAP® Series 4000 with ProScan B o u n d a r y S c a n

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Source URL: www.flynn.com

Language: English - Date: 2014-04-10 12:02:07
413Electronic engineering / Boundary scan / Joint Test Action Group / Engineering / Design for testing / Electronics manufacturing / Electronics / Technology

Eaton www.xjtag.com DATA CENTERS

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Source URL: www.xjtag.com

Language: English - Date: 2013-06-03 05:35:28
414Electronic engineering / Manufacturing / IEEE standards / Joint Test Action Group / Electronic design automation / Boundary scan / ProScan / Wiggler / DTS / Electronics / Embedded systems / Electronics manufacturing

onTAP® Series 4000 with ProScan B o u n d a r y S c a n

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Source URL: www.flynn.com

Language: English - Date: 2014-04-07 15:03:40
415Data analysis / Design of experiments / Statistical hypothesis testing / Statistical inference / Normal distribution / Expected value / Pre- and post-test probability / Variance / Statistics / Probability theory / Psychometrics

An Examination of Measurement Decision Risk and Other Measurement Quality Metrics Speaker/Author: Dr. Howard Castrup President, Integrated Sciences GroupCasitas Canyon Rd

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Source URL: www.isgmax.com

Language: English - Date: 2009-11-19 22:38:00
416Electronic engineering / Boundary scan / OnTap / Joint Test Action Group / Design for testing / Electronics manufacturing / Manufacturing / Electronics

onTAP Technical Support Application Note Technical Support Highlights: Support

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Source URL: www.flynn.com

Language: English - Date: 2015-03-10 14:16:23
417Electromagnetism / Electronic design automation / Joint Test Action Group / Boundary scan / Netlist / Cross-linked polyethylene / Electronics manufacturing / Manufacturing / Electronic engineering

onTAP Managing Modules Application Note Managing Modules Highlights: Managing Modules

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Source URL: www.flynn.com

Language: English - Date: 2015-03-10 14:16:19
418Porthole / Ship construction / Windows / Villeroy / Stainless steel / Bespoke / Kitchen / Floral design / Floristry / Visual arts / Architecture / Construction

SBID Subject: FW: [TEST] SBID Product Newsletter OctoberView this email online | Forward to a colleague »

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Source URL: www.sbid.org

Language: English - Date: 2015-01-16 09:48:00
419Cognitive science / Psychological testing / Neuropsychological assessment / Attention-deficit hyperactivity disorder / Metacognition / Cognitive flexibility / Neuropsychological test / Cognitive test / Educational psychology / Psychology / Mind / Neuropsychology

Supporting Cognitive Adaptability through Game Design

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Source URL: www.adlnet.gov

Language: English - Date: 2013-02-04 12:27:26
420Prototype / Design / Mockup / Usability / Human–computer interaction / Technical communication / Software prototyping / Paper prototyping / Technology / Business / Industrial design

METHOD Prototype to Test WHY prototype to test Prototyping to test is the iterative generation of low-resolution artifacts that probe different aspects of your

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Source URL: futureofstuffchallenge.org

Language: English - Date: 2013-09-16 19:42:55
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